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Process Capability Calculator (Cp, Cpk)

Paste measurements to get Cp, Cpk, Pp, Ppk, a histogram and expected defect rates

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Enter measurements and spec limits to get the process capability indices Cp, Cpk, Pp and Ppk, a histogram and the expected defect rate in PPM. Use it to see how comfortably a process meets its specification, or to report capability.

How to use

  1. Paste spreadsheet values into "Measurements": one column for individual values, several columns for one subgroup per row. A "Subgroup size" cuts a single column into subgroups.
  2. Enter the "Lower spec limit (LSL)" and/or "Upper spec limit (USL)". A "Target" adds Cpm.
  3. Read the within (Cp) and overall (Pp) indices, expected PPM and sigma level, with the histogram and normality test.
  4. Keep the results with "Copy results" or "Save chart as PNG".

How it works

Questions and answers

What is the difference between Cp and Cpk?
Cp compares only the specification width with the spread; Cpk also counts how far the mean is off centre. With USL 20, LSL 8, mean 16 and standard deviation 2, Cp is 1.00 but Cpk is 0.67.
What is the difference between Cpk and Ppk?
Cpk uses the within standard deviation from variation inside subgroups; Ppk uses the standard deviation of all data. If the mean shifts between subgroups, Ppk is smaller.
What does a Cpk of 1.33 mean?
The nearer spec limit is 4 standard deviations from the mean (1.33 × 3 = 4).
What if my data are not normally distributed?
Interpret Cpk and PPM with care. Check the normality test, the histogram and the count of values actually outside the limits.